PROCESAMIENTO DE UN INTERFEROGRAMA MEDIANTE LabVIEW Y SU APLICACIÓN COMO SENSOR DE PRESIÓN (INTERFEROMETER PATTERN PROCESSING BY LabVIEW AND ITS APPLICATION LIKE A PRESSURE SENSOR)
Resumen
En este trabajo se presentan los resultados del análisis y el procesado de interferogramas dinámicos producidos por un sensor de presión basado en un interferómetro de Michelson. La versatilidad del programa desarrollado en Vision LabVIEW permite tratar patrones de interferencia con diferentes características y en tiempo real. Los resultados del análisis permiten la calibración del sensor con un rango de sensado de 2.17 a 13.87 MPa y con una resolución de 0.43 MPa. El sistema implementado y los resultados del análisis pueden aplicarse a otros sensores o dispositivos interferométricos.
Palabras Clave: Análisis de señales, sensores interferométricos, procesado de señales
Abstract
We present the results of the analysis and signal processing in dynamic interferometer patterns produced by a pressure sensor based in a Michelson interferometer. The program developed in Vision LabVIEW allows to treat different interference patterns in real time. The results of the analysis are used in the characterization and optimization of the sensor with a sensing range of 2.17 to 13.87 MPa and 0.43 MPa like resolution. The implemented system and the results of the analysis can be applied to other sensors or interferometric devices.
Keywords: Analysis of images, interferometry sensors, signal processing.
Texto completo:
663-675 PDFReferencias
Badami, V. and Abruña, E., Absolutely: small sensor, big performance, MIKRONIEK (1), 5‐9 (2018).
Bechstein, K.‐H. and Fuchs, W., Absolute interferometric distance measurements applying a variable synthetic wavelength, Journal of Optics 29 (3), 179‐182 (1998).
De Groot, P, Optical Metrology, in The Optics Encyclopedia, edited by T. G. Brown, et al., pp. 2085‐2117, (Wiley‐VCH, Berlin, 2004).
Deck, L. L., Fourier‐Transform Phase‐Shifting Interferometry, Applied Optics 42 (13), 2354‐2365 (2003).
De Groot, P., Unusual techniques for absolute distance measurement, Optical Engineering 40 (1), 28‐32 (2001).
De Groot, P., Interferometric laser profilometer for rough surfaces, Optics Letters 16 (6),357 (1991).
De Groot. P., Derivation of algorithms for phase‐shifting interferometry using the concept of a data‐sampling window, Applied Optics 34 (22), 4723‐4730 (1995).
Evans, C., Holmes, M., Demarest, F., Newton, D. and Stein, A., Metrology and Calibration of a Long Travel Stage, CIRP Annals ‐ Manufacturing Technology 54 (1), 495‐498 (2005).
Freischlad, K. and Koliopoulos, C. L., Fourier description of digital phase‐measuring interferometry, Journal of the Optical Society of America A 7 (4), 542‐551 (1990).
Krohn, D. A., MacDougall, T. W. and A. Mendez, "Fiber Optic Sensors: Fundamentals and Applications," 4th ed., Vol.PM247, (SPIE Press, 2015).
Mantravadi, M. V. and Malacara, D., Newton, Fizeau, and Haidinger Interferometers, in Optical Shop Testing, edited by D. Malacara, pp. 361‐394, (Wiley‐Interscience, 2007).
Schmit, J., Creath, K. and Wyant, J. C., Surface Profilers, Multiple Wavelength, and White Light Intereferometry, in Optical Shop Testing, edited by D. Malacara, pp. 667‐755, (John Wiley & Sons, Inc., Hoboken, New Jersey, 2006).
Sigg, D., The advanced LIGO detectors in the era of first discoveries, in SPIE OpticalEngineering + Applications, 9960, 9 (SPIE, 2016).
Surrel, Y., Design of algorithms for phase measurements by the use of phase stepping, Appl Opt 35 (1), 51‐60 (1996).
Takacs, P. Z., Li, M. X., Furenlid, K. and Church, E. L., Step‐height standard for surfaceprofiler calibration, in Optical Scattering, Proc. SPIE 1995, 235‐244 (1993).
Wyant, J. C., Dynamic Interferometry, Optics Photonics News. Vol 14, p 36 (2003).
URL de la licencia: https://creativecommons.org/licenses/by/3.0/deed.es
Pistas Educativas está bajo la Licencia Creative Commons Atribución 3.0 No portada. 
TECNOLÓGICO NACIONAL DE MÉXICO / INSTITUTO TECNOLÓGICO DE CELAYA
Antonio García Cubas Pte #600 esq. Av. Tecnológico, Celaya, Gto. México
Tel. 461 61 17575 Ext 5450 y 5146
pistaseducativas@itcelaya.edu.mx